Quantum imaging

Abstract

We use multi-photon interferences from statistically independent classical or non-classical light sources in combination with linear or non-linear optical detection techniques to reconstruct, i.e., image, arbitrary source geometries with subclassical resolution. Our far-field reconstruction algorithms have opened the field of Incoherent Diffraction Imaging (IDI) which – if applied to x-ray structure determination – leads to the highest resolution obtained in radiation-based microscopy of incoherent scatterers.

Publications

Kim YY., Gelisio L., Mercurio G., Dziarzhytski S., Beye M., Bocklage L., Classen A., David C., Gorobtsov OY., Khubbutdinov R., Lazarev S., Mukharamova N., Obukhov YN., Roesner B., Schlage K., Zaluzhnyy IA., Brenner G., Roehlsberger R., von Zanthier J., Wurth W., Vartanyants IA.:
Ghost imaging at an XUV free-electron laser
In: Physical Review A 101 (2020)
ISSN: 1050-2947
DOI: 10.1103/PhysRevA.101.013820
Classen A., von Zanthier J., Agarwal GS.:
Analysis of super-resolution via 3D structured illumination intensity correlation microscopy
In: Optics Express 26 (2018), S. 27492-27503
ISSN: 1094-4087
DOI: 10.1364/OE.26.027492
Schneider R., Mehringer T., Mercurio G., Wenthaus L., Classen A., Brenner G., Gorobtsov O., Benz A., Bhatti D., Bocklage L., Fischer B., Lazarev S., Obukhov Y., Schlage K., Skopintsev P., Wagner J., Waldmann F., Willing S., Zaluzhnyy I., Wurth W., Vartanyants IA., Rohlsberger R., von Zanthier J.:
Quantum imaging with incoherently scattered light from a free-electron laser
In: Nature Physics 14 (2018), S. 126-129
ISSN: 1745-2473
DOI: 10.1038/NPHYS4301
Classen A., Ayyer K., Chapman HN., Roehlsberger R., von Zanthier J.:
Incoherent Diffractive Imaging via Intensity Correlations of Hard X Rays
In: Physical Review Letters 119 (2017), Art.Nr.: 053401
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.119.053401
Classen A., von Zanthier J., Scully MO., Agarwal GS.:
Superresolution via structured illumination quantum correlation microscopy
In: Optica 4 (2017), S. 580-587
ISSN: 2334-2536
DOI: 10.1364/OPTICA.4.000580